Methodology for analysis of defects in electronic assembly using Xray
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2 articles.
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1. Recursive CNN Model to Detect Anomaly Detection in X-Ray Security Image;2022 2nd International Conference on Innovative Practices in Technology and Management (ICIPTM);2022-02-23
2. A serial-timing multi-channel CMOS charge readout ASIC for X-ray detectors;IEICE Electronics Express;2021-08-25