A serial-timing multi-channel CMOS charge readout ASIC for X-ray detectors-Reference-Cited by-同舟云学术

A serial-timing multi-channel CMOS charge readout ASIC for X-ray detectors

Published:2021-08-25 Issue:16 Volume:18 Page:20210224-20210224
ISSN:1349-2543
Container-title:IEICE Electronics Express
language:en
Short-container-title:IEICE Electron. Express

Author:

Wang Mingliang¹,Qin Ronghua²,Wang Jiang²,Zhang Xinyi¹,Gu Zhengfeng¹,Li Baoqing¹,Yuan Xiaobing¹

Affiliation:

1. Science and Technology on Micro-system Laboratory

2. Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.jstage.jst.go.jp/article/elex/18/16/18_18.20210224/_pdf

Reference30 articles.

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3. [3] M. Choquette, et al.: “Performance of a real time selenium based x-ray detector for fluoroscopy,” Proc. SPIE 4320 (2001) 501 (DOI: 10.1117/12.430873).

4. [4] P.R. Granfors, et al.: “Performance of a 41 × 41 cm² amorphous silicon flat panel x-ray detector designed for angiographic and R&F imaging applications,” Med. Phys. 30 (2003) 2715 (DOI: 10.1118/1.1609151).

5. [5] V. Tsenev: “Methodology for analysis of defects in electronic assembly using X-ray,” 2018 IEEE XXVII International Scientific Conference Electronics - ET (2018) 1 (DOI: 10.1109/ET.2018.8549637).

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