Author:
Da Rosa Thiago Raupp,Lemaire Romain,Clermidy Fabien
Cited by
1 articles.
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1. Back-bias impact on variability and BTI for 3D-monolithic 14nm FDSOI SRAMs applications;2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS);2019-04