A Highly Stable Leakage-Based Silicon Physical Unclonable Functions
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5716645/5718759/05718791.pdf?arnumber=5718791
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. DA PUF;Proceedings of the 59th ACM/IEEE Design Automation Conference;2022-07-10
2. Highly Secure Physically Unclonable Cryptographic Primitives Based on Interfacial Magnetic Anisotropy;Nano Letters;2018-10-26
3. Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point;Chinese Journal of Electronics;2018-07
4. A multi-port low-power current mode PUF using MOSFET current-division deviation in 65 nm technology;Microelectronics Journal;2017-09
5. PUF-Based Authentication;Fundamentals of IP and SoC Security;2017
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