Highly Reliable Multiport PUF Circuit Based on MOSFET Zero Temperature Coefficient Point
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Published:2018-07
Issue:4
Volume:27
Page:873-878
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ISSN:1022-4653
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Container-title:Chinese Journal of Electronics
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language:en
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Short-container-title:Chin. j. electron.
Author:
Li Gang1,
Wang Pengjun1,
Qian Haoyu1
Affiliation:
1. Institute of Circuits and SystemsNingbo UniversityNingbo315211China
Funder
National Natural Science Foundation of China
Natural Science Foundation of Zhejiang Province
Publisher
Institution of Engineering and Technology (IET)
Subject
Applied Mathematics,Electrical and Electronic Engineering