A Novel Subpixel Industrial Chip Detection Method Based on the Dual-Edge Model for Surface Mount Equipment

Author:

Liu Weihua1ORCID,Zhang Yuanming1ORCID,Yu Xinghu2ORCID

Affiliation:

1. Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China

2. Ningbo Institute of Intelligent Equipment Technology Company, Ltd., Ningbo, China

Funder

National Natural Science Foundation of China

Major Program for Science and Technology Development of Ningbo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

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5. ultralytics/yolov5: V3.0;jocher,2020

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