A Deep Regression Framework Toward Laboratory Accuracy in the Shop Floor of Microelectronics
Author:
Affiliation:
1. Information Technologies Institute, Centre for Research and Technology Hellas (CERTH-ITI), Thessaloniki, Greece
2. Microchip Technology Inc., Caldicot, U.K.
Funder
European Commission through Project OPTIMAI funded by the European Union H2020 programme
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering
Link
http://xplorestaging.ieee.org/ielx7/9424/10064202/09795063.pdf?arnumber=9795063
Reference30 articles.
1. An End-to-End Steel Surface Defect Detection Approach via Fusing Multiple Hierarchical Features
2. Deep Residual Shrinkage Networks for Fault Diagnosis
3. Multisensor Feature Fusion for Bearing Fault Diagnosis Using Sparse Autoencoder and Deep Belief Network
4. Deep multi-sensorial data analysis for production monitoring in hard metal industry
5. Delving Deep into Rectifiers: Surpassing Human-Level Performance on ImageNet Classification
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