Author:
Girard P.,Landrault C.,Pravossoudovitch S.,Virazel A.,Wunderlich H.-J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
19 articles.
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2. Deterministic Stellar BIST for Automotive ICs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-08
3. Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-04
4. Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-03
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