Author:
Aragones X.,Gonzalez J.L.,Moll F.,Rubio A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
16 articles.
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1. A Method to Support Diagnostics of Dynamic Faults in Networks of Interconnections;International Journal of Electronics and Telecommunications;2023-07-26
2. Study on Voltage Influence on FPGA-Based Time-to-Digital Converters;2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2023-05-22
3. Introduction;Test Generation of Crosstalk Delay Faults in VLSI Circuits;2018-09-21
4. Design, analysis and test of high-frequency interconnections in 2.5D package with silicon interposer;Journal of Semiconductors;2016-04
5. New Structure of Test Pattern Generator Stimulating Crosstalks in Bus-type Connections;International Journal of Electronics and Telecommunications;2015-03-01