Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
6 articles.
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1. Status of ion beam data analysis and simulation software;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-03
2. Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool;Journal of Physics D: Applied Physics;2003-03-19
3. Effect of surface topography on scanning RBS microbeam measurements;Vacuum;1998-07
4. Application of grazing exit angle in RBS microprobe measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
5. RBS spectra for thin films with surface roughness;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-12