Author:
Du Xiaogang,Mukherjee Nilanjan,Hill Chris,Cheng Wu-tung,Reddy Sudhakar
Cited by
3 articles.
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1. Testing Embedded Memories: A Survey;Mathematical and Engineering Methods in Computer Science;2013
2. An Effective Programmable Memory BIST for Embedded Memory;IEICE Transactions on Information and Systems;2009
3. A new approach to the design of built-in internal memory self-testing devices;Automatic Control and Computer Sciences;2008-08