On the microscopic structure of hole traps in pMOSFETs-Reference-Cited by-同舟云学术

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On the microscopic structure of hole traps in pMOSFETs

Published:2014-12 Issue: Volume: Page:
ISSN:
Container-title:2014 IEEE International Electron Devices Meeting
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Author:

Grasser T.,Goes W.,Wimmer Y.,Schanovsky F.,Rzepa G.,Waltl M.,Rott K.,Reisinger H.,Afanas'ev V.V.,Stesmans A.,El-Sayed A.-M.,Shluger A.L.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7038718/7046955/07047093.pdf?arnumber=7047093

Cited by 75 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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