Application specific trade-offs for WBG SiC, GaN and high end Si power switch technologies
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7038718/7046955/07046965.pdf?arnumber=7046965
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Enhanced Gate Reliability of Ohmic-Like p-GaN Gate HEMT With a Built-in Reverse Diode;IEEE Transactions on Electron Devices;2024-04
2. A new gate design combined MIS and p-GaN gate structures for normally-off and high on-current operation;Japanese Journal of Applied Physics;2024-03-01
3. An AlGaN-GaN HEMT with p-GaN Extended Gate for Improvements on Current Dispersion and Breakdown Characteristics;ECS Journal of Solid State Science and Technology;2024-01-01
4. Suppression of Buffer Trapping Effect in GaN-on-Si Active-Passivation p-GaN Gate HEMT via Light/Hole Pumping;IEEE Transactions on Electron Devices;2024-01
5. Total Ionizing Dose Effects on the Threshold Voltage of GaN Cascode Devices;Micromachines;2023-09-26
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