Cosmic radiation as a cause for power device failure and possible countermeasures-Reference-Cited by-同舟云学术

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Cosmic radiation as a cause for power device failure and possible countermeasures

Published: Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics
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Author:

Kabza H.,Schulze H.-J.,Gerstenmaier Y.,Voss P.,Schmid J.W.W.,Pfirsch F.,Platzoder K.

Publisher

Hartung-Gorre Verlag

Link

http://xplorestaging.ieee.org/ielx2/4460/12642/00583620.pdf?arnumber=583620

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3. Sensitivity study of super-junction power MOSFETs by spatial and depth resolved heavy ion SEE mapping with various bias, LETs and ion ranges;Microelectronics Reliability;2024-04

4. Single event burnout failures caused in silicon carbide power devices by alpha particles emitted from radionuclides;e-Prime - Advances in Electrical Engineering, Electronics and Energy;2023-09

5. Reliability analysis of multilevel and matrix converters used in more electric aircraft;IET Electrical Systems in Transportation;2023-04-29

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