Affiliation:
1. College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China
Funder
National Natural Science Foundation of China
Guangdong Basis and Applied Basic Research Foundation
Shenzhen-Hong Kong Joint Innovation Foundation
Fundamental Research Foundation of Shenzhen
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
5 articles.
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1. Enhancing the Reliability of SC PUF Through Optimal Capacitor Configuration;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-01
2. Schmitt-Trigger Based Physically Unclonable Function with Variable Vt;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06
3. Design Optimization of Leakage Based PUF Circuit targeting at Ultra-Low Voltage Operation;2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2023-06-25
4. Power and Area Aware Bump Physically Unclonable Function;2023 International Conference on Computer, Electronics & Electrical Engineering & their Applications (IC2E3);2023-06-08
5. A Subthreshold-Inverter-Based Strong PUF with High Reliability and Energy Efficiency;2023 IEEE International Symposium on Circuits and Systems (ISCAS);2023-05-21