Author:
Sundstrom T.,Alvandpour A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
28 articles.
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1. 500 MS/s 4-Bit Flash ADC with Complementary Architecture;Journal of Electromagnetic Engineering and Science;2024-01-31
2. Design of Reference-free Flash ADC With On-chip Rank-based Comparator Selection Using Multiple Comparator Groups;IPSJ Transactions on System and LSI Design Methodology;2024
3. Feedback Stochastic ADC;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06
4. Measurement of Temperature Effect on Comparator Offset Voltage Variation;2023 35th International Conference on Microelectronic Test Structure (ICMTS);2023-03-27
5. Reliable measurement using unreliable binary comparisons;Signal Processing;2023-02