A Cell Classifier for RRAM Process Development-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A Cell Classifier for RRAM Process Development

Published:2015-07 Issue:7 Volume:62 Page:676-680
ISSN:1549-7747
Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
language:
Short-container-title:IEEE Trans. Circuits Syst. II

Author:

Gupta Isha,Serb Alexantrou,Berdan Radu,Khiat Ali,Regoutz Anna,Prodromakis Themis

Funder

CHIST-ERA

University of Southampton

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8920/7134813/07063944.pdf?arnumber=7063944

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automated RRAM measurements using a semi-automated probe station and ArC ONE interface;2023 35th International Conference on Microelectronic Test Structure (ICMTS);2023-03-27

2. Automated Testing Algorithm for the Improvement of 1T1R ReRAM Endurance;IEEE Transactions on Electron Devices;2021-10

3. Switching the resistive memory behavior from binary to ternary logic via subtle polymer donor and molecular acceptor design;Journal of Materials Chemistry C;2021

4. Sneak Path Free Reconfiguration With Minimized Programming Steps for Via-Switch Crossbar-Based FPGA;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10

5. Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories;IEEE Journal of the Electron Devices Society;2019

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP