Automated RRAM measurements using a semi-automated probe station and ArC ONE interface
Author:
Affiliation:
1. Institute for Integrated Micro and Nano Systems, University of Edinburgh,Edinburgh,UK
2. Materials Science And Metallurgical Engineering, Indian Institute of Technology Hyderabad,Telangana,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10094038/10094053/10094156.pdf?arnumber=10094156
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1. Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips
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1. Single-trial detection of auditory cues from the rat brain using memristors;Science Advances;2024-09-06
2. Statistical investigation of SnOx RRAM memories for switching characteristics;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15
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