Author:
Zimpeck Alexandra L.,Meinhardt Cristina,Reis Ricardo
Cited by
5 articles.
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1. Fast and Low-Error Prediction of Logic Gate Cell Characterization;2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2023-12-04
2. New Modified 4:2 Approximate Compressors for Low-Power Applications;2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2023-08-28
3. Using Lyapunov Exponents to Estimate Sensitivity to Process Variability;2023 IEEE 14th Latin America Symposium on Circuits and Systems (LASCAS);2023-02-27
4. Temperature Dependence of Critical Charge and Collected Charge in 5-nm FinFET SRAM;IEEE Transactions on Nuclear Science;2023
5. Reliability Challenges in FinFETs;Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs;2021