Using Lyapunov Exponents to Estimate Sensitivity to Process Variability
Author:
Affiliation:
1. Instituto de Informatica, PGMicro/PPGC, Universidade Federal do Rio Grande do Sul,Porto Alegre,Brazil
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10108078/10108098/10108159.pdf?arnumber=10108159
Reference17 articles.
1. Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices
2. Computational Complexity Analysis for Monte Carlo Approximations of Classically Scaled Population Processes
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Comparing the Effects of Process Variability in FinFETs and CNFETs;2024 IEEE 15th Latin America Symposium on Circuits and Systems (LASCAS);2024-02-27
2. Using Lyapunov Exponents and Entropy to Estimate Sensitivity to Process Variability;2023 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2023-06-20
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