An AI Architecture for Power MOS Rds-on-Driven Lifetime Estimation-Reference-Cited by-同舟云学术

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An AI Architecture for Power MOS Rds-on-Driven Lifetime Estimation

Published:2023-03-28 Issue: Volume:5 Page:1-5
ISSN:
Container-title:2023 Smart Systems Integration Conference and Exhibition (SSI)
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Author:

Pino Carmelo¹,Rundo Francesco¹,Spampinato Concetto²,Battiato Sebastiano³

Affiliation:

1. STMicroelectronics,ADG Power and Discretes R&D Division,Catania,Italy

2. University of Catania,PerCeiVe Lab Group,Department of Electrical, Electronics and Computer Engineering,Catania,Italy

3. University of Catania,IP-LAB Group,Department of Mathematics and Computer Science,Catania,Italy

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10387937/10387754/10387960.pdf?arnumber=10387960

Reference24 articles.

1. Analysis of Voltage Variation in Silicon Carbide MOSFETs during Turn-On and Turn-Off

2. Monte Carlo Simulation With Incremental Damage for Reliability Assessment of Power Electronics

3. ECPE Guideline AQG 324 - Qualification of Power Modules for Use in Power Electronics Converter Units in Motor Vehicles;ECPE European Center for Power Electronics, Nuremberg, DE, Datasheet,2021

4. Remaining Useful Life Prediction of MOSFETs via the Takagi–Sugeno Framework

5. Overview of Real-Time Lifetime Prediction and Extension for SiC Power Converters

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