Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique

Author:

Vlagkoulis Vasileios1ORCID,Sari Aitzan1,Antonopoulos Georgios1ORCID,Psarakis Mihalis1ORCID,Tavoularis Antonios2,Furano Gianluca2ORCID,Boatella-Polo Cesar2,Poivey Christian2,Ferlet-Cavrois Veronique2,Kastriotou Maria3ORCID,Martinez Pablo Fernandez3ORCID,Alia Ruben Garcia3ORCID

Affiliation:

1. Department of Informatics, University of Piraeus, Piraeus, Greece

2. European Space Agency, ESTEC, Noordwijk, The Netherlands

3. CERN, Meyrin, Switzerland

Funder

European Space Agency

European Union and Greek National Funds through the Operational Program Competitiveness, Entrepreneurship and Innovation, by the call RESEARCH–CREATE–INNOVATE

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Recent advances on reliability of FPGAs in a radiation environment;Microelectronics Journal;2024-06

2. A Tool for Automatic Radiation-Hardened SRAM Layout Generation;2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2023-12-04

3. A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-12

4. Reliability Analysis of Fault Tolerant Memory Systems;2023 8th South-East Europe Design Automation, Computer Engineering, Computer Networks and Social Media Conference (SEEDA-CECNSM);2023-11-10

5. A Survey on Fault-Tolerance Methods for SRAM-Based FPGAs in Radiation Environments;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14

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