Proton Direct Ionization Upsets at Tens of MeV-Reference-Cited by-同舟云学术

Proton Direct Ionization Upsets at Tens of MeV

Published:2023-04 Issue:4 Volume:70 Page:314-321
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Coronetti Andrea¹^ORCID,Alía Rubén García¹^ORCID,Lucsanyi David¹^ORCID,Wang Jialei²^ORCID,Saigné Frédéric³,Javanainen Arto⁴^ORCID,Leroux Paul²^ORCID,Prinzie Jeffrey²^ORCID

Affiliation:

1. CERN, Geneva, Switzerland

2. Department of Electrical Engineering (ESAT), Katholieke Universiteit (KU) Leuven, Geel, Belgium

3. Institut d’Électronique et des Systèmes, Université de Montpellier, Montpellier, France

4. Department of Physics, University of Jyväskylä, Jyväskylä, Finland

Funder

European Union’s Horizon 2020 Research and Innovation Program under MSC

European Space Agency [ESA/European Space Research and Technology Center (ESTEC)] at the University of Jyväskylä

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx7/23/10103954/09895447.pdf?arnumber=9895447

Reference40 articles.

1. New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle

2. Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS

3. The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate

4. The Frascati Neutron Generator: A multipurpose facility for physics and engineering

5. Low energy proton induced single event upset in 65 nm DDR and QDR commercial SRAMs

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