Performance Analysis of the Analog Path of Read-Out Integrated Circuit for MEMS structures under Temperature Variation
Author:
Affiliation:
1. Lodz University of Technology,Department of Microelectronics and Computer Science,Lodz,Poland
Funder
Research and Development
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9899435/9899496/09899610.pdf?arnumber=9899610
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