Author:
Lee Kwonhyoung,Lee Sangjun,Park Jongho,Lee Inhwan,Kang Sungho
Funder
Ministry of Trade, Industry and Energy (MOTIE) and Korea Evaluation Institute of Industrial Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering,General Materials Science,General Computer Science
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Test Pattern Generation in BIST Architecture Using One-Hot Encoding;2023 4th International Conference on Smart Electronics and Communication (ICOSEC);2023-09-20
2. An Improved switching activity optimised LFSR for energy efficient BIST applications;2023 2nd International Conference on Vision Towards Emerging Trends in Communication and Networking Technologies (ViTECoN);2023-05-05
3. SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-11
4. Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST;2022 19th International SoC Design Conference (ISOCC);2022-10-19