Comprehensive Analysis of Gate-Induced Drain Leakage in Emerging FET Architectures: Nanotube FETs Versus Nanowire FETs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Comprehensive Analysis of Gate-Induced Drain Leakage in Emerging FET Architectures: Nanotube FETs Versus Nanowire FETs

Published:2017 Issue: Volume:5 Page:18918-18926
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Sahay Shubham^ORCID,Kumar Mamidala Jagadesh

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/7859429/08037985.pdf?arnumber=8037985

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Inverted T-Shaped Tunnel Field-Effect Transistors for Extremely Low Power Chip Applications;2024 IEEE 24th International Conference on Nanotechnology (NANO);2024-07-08

2. Performance enhancement of nanotube junctionless FETs with low doping concentration rings;Semiconductor Science and Technology;2024-06-06

3. Modeling of inner-outer gates and temperature dependent gate-induced drain leakage current of junctionless double-gate-all-around FET;Microelectronics Journal;2024-04

4. Logic-in-memory application of silicon nanotube-based FBFET with core-source architecture;Microelectronics Journal;2024-04

5. Revisiting Lateral-BTBT Gate-Induced Drain Leakage in Nanowire FETs for 1T-DRAM;IEEE Transactions on Electron Devices;2024-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP