Nwise and Pwise: 10T Radiation Hardened SRAM Cells for Space Applications With High Reliability Requirements-Reference-Cited by-同舟云学术

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Nwise and Pwise: 10T Radiation Hardened SRAM Cells for Space Applications With High Reliability Requirements

Published:2022 Issue: Volume:10 Page:30624-30642
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Seyedi Azam¹^ORCID,Aunet Snorre¹^ORCID,Kjeldsberg Per Gunnar¹^ORCID

Affiliation:

1. Department of Electronic Systems, Faculty of Information Technology and Electrical Engineering, Norwegian University of Science and Technology (NTNU), Trondheim, Norway

Funder

European Union’s Horizon 2020 Research and Innovation Program under the Marie Sklodowska-Curie

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/9668973/09729754.pdf?arnumber=9729754

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. System-Scenario Methodology to Design a Highly Reliable Radiation-Hardened Memory for Space Applications;Computer Memory and Data Storage;2024-01-10

2. Introductory Chapter: Computer Memory and Data Storage;Computer Memory and Data Storage;2024-01-10

3. Design a Hybrid Memory Array for Radiation-Hardened SRAM in Satellite Image Compression Systems;2023-10-12

4. Radiation-hardened 14T SRAM cell by polar design for space applications;IEICE Electronics Express;2023-07-10

5. A High-Reliability 12T SRAM Radiation-Hardened Cell for Aerospace Applications;Micromachines;2023-06-25

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