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Characterization of Parasitic Impedance in PCB Using a Flexible Test Probe Based on a Curve-Fitting Method

  • Published:2021 Issue: Volume:9 Page:40695-40705
  • ISSN:2169-3536
  • Container-title:IEEE Access
  • language:
  • Short-container-title:IEEE Access

Author:

Llamazares A.ORCID,Garcia-Gracia M.ORCID,Martin-Arroyo S.ORCID

Funder

Electronic Components and Systems for European Leadership

Gobierno de Aragn

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Combination Method for Impedance Extraction of SMD Electronic Components Based on Full-Wave Simulation and De-Embedding Technique;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2024-08-01

2. Simulation Research on Parasitic Parameter Extraction of LDO Power Chip Package Based on ANSYS Q3D;2023 7th International Conference on Automation, Control and Robots (ICACR);2023-08-04

3. Four-phase Buck Converter Design and Thermal Modeling Using FEA Simulation;2022 14th Seminar on Power Electronics and Control (SEPOC);2022-11-12

4. PCB Characteristic Impedance Prediction based on an Error Compensated Random Forest Regression Model;2022 34th Chinese Control and Decision Conference (CCDC);2022-08-15

5. Chemically Integrated Ni-P Film Resistors with Controllable Resistance Values on Printed Circuit Board;2022 23rd International Conference on Electronic Packaging Technology (ICEPT);2022-08-10
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