Analog checkers with absolute and relative tolerances

Author:

Kolarik V.,Mir S.,Lubaszewski M.,Courtois B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

2. Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25

3. SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety;IEEE Transactions on Circuits and Systems I: Regular Papers;2021-06

4. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14

5. Checkers for Online Self-Testing of Analog Circuits;Advanced Circuits for Emerging Technologies;2012-05-07

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