Co-integration of 2 mV/dec Subthreshold Slope Impact Ionization MOS (I-MOS) with CMOS-Reference-Cited by-同舟云学术

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Co-integration of 2 mV/dec Subthreshold Slope Impact Ionization MOS (I-MOS) with CMOS

Published:2006-09 Issue: Volume: Page:
ISSN:1930-8876
Container-title:2006 European Solid-State Device Research Conference
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Author:

Mayer F.,Royer C.,Carval G.,Tabone C.,Clavelier L.,Deleonibus S.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4099836/4099837/04099916.pdf?arnumber=4099916

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