Defect Classification of Printed Circuit Boards based on Transfer Learning-Reference-Cited by-同舟云学术

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Defect Classification of Printed Circuit Boards based on Transfer Learning

Published:2018-12 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE Applied Signal Processing Conference (ASPCON)
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Author:

Ghosh Barnajit,Bhuyan M. K.,Sasmal Pradipta,Iwahori Yuji,Gadde Prathik

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8743096/8748277/08748670.pdf?arnumber=8748670

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on PCB defect detection using artificial intelligence: a systematic mapping study;Evolutionary Intelligence;2024-04-02

2. Challenges for Automating PCB Layout;Proceedings of the 2024 International Symposium on Physical Design;2024-03-12

3. Defect inspection in semiconductor images using FAST-MCD method and neural network;The International Journal of Advanced Manufacturing Technology;2023-10-03

4. Review of vision-based defect detection research and its perspectives for printed circuit board;Journal of Manufacturing Systems;2023-10

5. Application of Machine Learning for Quality Risk Factor Analysis of Electronic Assemblies;2023 24th International Symposium on Quality Electronic Design (ISQED);2023-04-05

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