Author:
Sirohi Saurabh,Jain Vibhor,Raman Ajay,Nukala Bhargava,Veeramani Elan,Adkisson James W.,Joseph Alvin
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Impact of Layout Parasitics and Thermal Coupling on PA performance and ruggedness in SiGe HBTs;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16
2. Ballast Resistor Temperature Effect and Ruggedness;2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS);2019-11