Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation

Author:

Akbay S.,Torres Jose,Rumer Julie,Chatterjee Abhijit,Amtsfield Joel

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04

2. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

3. Automatic Structural Test Generation for Analog Circuits using Neural Twins;2022 IEEE International Test Conference (ITC);2022-09

4. A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters;Journal of Electronic Testing;2018-05-03

5. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14

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