Invisible delay quality - SDQM model lights up what could not be seen-Reference-Cited by-同舟云学术

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Invisible delay quality - SDQM model lights up what could not be seen

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Container-title:IEEE International Conference on Test, 2005.
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Author:

Sato Y.,Hamada S.,Maeda T.,Takatori A.,Nozuyama Y.,Kajihara S.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/10560/33431/01584088.pdf?arnumber=1584088

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

2. An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

3. Optimal Test Clock Frequency Based Test Option Generation for Small Delay Defects;IEEE Access;2023

4. A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits;Applied Sciences;2022-09-10

5. Enhanced DFT for Fortuitous Detection of Transition Faults During Scan Shift;2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS);2022-05-23

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