Cost Effective Outliers Screening with Moving Limits and Correlation Testing for Analogue ICs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/4079296/4042774/04079369.pdf?arnumber=4079369
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Transformer and Its Variants for Identifying Good Dice in Bad Neighborhoods;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Outlier Detection for Analog Tests Using Deep Learning Techniques;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
3. A Low Cost Self-Adaptive Screening Method Based on Automatic Test Equipment for Low Dropout Voltage Regulators in Mass Production;IEEE Access;2023
4. Moving Limits: A More Effective Approach in Outlier Screening at Final Test;2022 IEEE 24th Electronics Packaging Technology Conference (EPTC);2022-12-07
5. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22
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