FPGA test and coverage
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/8073/22329/01041811.pdf?arnumber=1041811
Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. ISFD: Efficient and Fault-tolerant In-System-Failure-Detection for LP FPGA-based Smart-Sensors in Space Expeditions;2024 20th International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT);2024-04-29
2. Research on an Intelligent Test Method for Interconnect Resources in an FPGA;Applied Sciences;2023-07-07
3. A Reinforcement Learning-Based Markov-Decision Process (MDP) Implementation for SRAM FPGAs;IEEE Transactions on Circuits and Systems II: Express Briefs;2020-10
4. Redundant Arithmetic Based High Speed Carry Free Hybrid Adders with Built-In Scan Chain on FPGAs;2017 IEEE 24th International Conference on High Performance Computing (HiPC);2017-12
5. A Routability-Aware Algorithm for Both Global and Local Interconnect Resource Test and Diagnosis of Xilinx SRAM-FPGAs;Journal of Electronic Testing;2016-11-09
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