Author:
Huang Yu,Cheng Wu-tung,Tamarapalli Nagesh,Rajski Janusz,Klingenberg Randy,Hsu Will,Chen Yuan-shih
Cited by
3 articles.
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1. Dummy Faulty Units for Reduced Fail Data Volume From Logic Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-11
2. Test Modification for Reduced Volumes of Fail Data;ACM Transactions on Design Automation of Electronic Systems;2017-07-22
3. Generation of Transparent-Scan Sequences for Diagnosis of Scan Chain Faults;ACM Transactions on Design Automation of Electronic Systems;2017-05-31