Author:
Wohl P.,Waicukauski J.A.,Patel S.,Amin M.B.
Cited by
48 articles.
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1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. DIST: Deterministic In-System Test with X-masking;2022 IEEE International Test Conference (ITC);2022-09
3. Selective Multiple Capture Test (SMART) XLBIST;2022 IEEE International Test Conference India (ITC India);2022-07-24
4. X-Masking for In-System Deterministic Test;2022 IEEE European Test Symposium (ETS);2022-05-23
5. X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-08