A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior-Reference-Cited by-同舟云学术

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A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior

Published:2006-10 Issue: Volume: Page:
ISSN:1089-3539
Container-title:2006 IEEE International Test Conference
language:
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Author:

Desineni R.,Poku O.,Blanton R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4079296/4042774/04079305.pdf?arnumber=4079305

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Logic-AAA: Debug of Logic Failures with an on-ATE Expert System;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

2. Machine Learning Support for Logic Diagnosis and Defect Classification;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

3. Intra-Cell Defects Diagnosis;Journal of Electronic Testing;2014-09-30

4. Physical‐aware systematic multiple defect diagnosis;IET Computers & Digital Techniques;2014-09

5. Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear Programming;Journal of Electronic Testing;2011-10-22

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