Lifetesting GaAs MMICs under RF stimulus-Reference-Cited by-同舟云学术

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Lifetesting GaAs MMICs under RF stimulus

Published:1992 Issue:12 Volume:40 Page:2452-2460
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Roesch W.J.,Rubalcava T.,Hanson C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx1/22/4502/00179916.pdf?arnumber=179916

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Role of RF Operational Life Testing in Evaluating III-V Devices Addressing RF Through Millimeter-wave Applications;2020 IEEE International Reliability Physics Symposium (IRPS);2020-04

2. Design and Temperature Reliability Testing for A 0.6–2.14GHz Broadband Power Amplifier;Journal of Electronic Testing;2016-02-05

3. Reliability Studies in the Real World;Materials and Reliability Handbook for Semiconductor Optical and Electron Devices;2012-08-23

4. Improving Thermal Reliability of FETs and MMICs;IEEE Transactions on Device and Materials Reliability;2011-03

5. High-Resolution Raman Temperature Measurements in GaAs p-HEMT Multifinger Devices;IEEE Transactions on Electron Devices;2007-08

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