VLSI limitations from drain-induced barrier lowering-Reference-Cited by-同舟云学术

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VLSI limitations from drain-induced barrier lowering

Published:1979-04 Issue:2 Volume:14 Page:383-391
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Troutman R.R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/22564/01051189.pdf?arnumber=1051189

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