A progressive scan CCD image sensor for DSC applications-Reference-Cited by-同舟云学术

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A progressive scan CCD image sensor for DSC applications

Published:2000-12 Issue:12 Volume:35 Page:2044-2054
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Yamada T.,Ikeda K.,Yong-Gwan Kim ,Wakoh H.,Toma T.,Sakamoto T.,Ogawa K.,Okamoto E.,Masukane K.,Oda K.,Inuiya M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/19274/00890321.pdf?arnumber=890321

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A New Intensity Adjustment Technique of Emission Spectral Analysis When Measured at the Upper Limit of the Dynamic Range of Charge-Coupled Devices;Applied Sciences;2022-06-29

2. A New Technique of Eliminating the Actual Plasma Background When Calibrating Emission Spectrometers with a CCD Recording System;Applied Sciences;2022-03-11

3. Purinergic dysregulation causes hypertensive glaucoma–like optic neuropathy;JCI Insight;2017-10-05

4. A 2.8 µm Pixel-Pitch 55 ke-Full-Well Capacity Global-Shutter Complementary Metal Oxide Semiconductor Image Sensor Using Lateral Overflow Integration Capacitor;Japanese Journal of Applied Physics;2013-04-01

5. Pixel Scaling in Complementary Metal Oxide Silicon Image Sensor with Lateral Overflow Integration Capacitor;Japanese Journal of Applied Physics;2010-04-20

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