An easy-to-use mismatch model for the MOS transistor-Reference-Cited by-同舟云学术

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An easy-to-use mismatch model for the MOS transistor

Published:2002-08 Issue:8 Volume:37 Page:1056-1064
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Croon J.A.,Rosmeulen M.,Decoutere S.,Sansen W.,Maes H.E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/21945/01020245.pdf?arnumber=1020245

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