Improving Drain-Induced Barrier Lowering Effect and Hot Carrier Reliability With Terminal via Structure on Half-Corbino Organic Thin-Film Transistors-Reference-Cited by-同舟云学术

Improving Drain-Induced Barrier Lowering Effect and Hot Carrier Reliability With Terminal via Structure on Half-Corbino Organic Thin-Film Transistors

Published:2022-04 Issue:4 Volume:43 Page:569-572
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Hung Yang-Hao¹,Chang Ting-Chang¹^ORCID,Tu Yu-Fa²^ORCID,Lu I-Nien³,Zheng Yu-Zhe⁴,Chiang Cheng-Ling³,Chen Jian-Jie¹,Kuo Chuan-Wei⁴,Sun Li-Chuan⁴,Zhou Kuan-Ju¹

Affiliation:

1. Department of Physics, National Sun Yat-sen University, Kaohsiung, Taiwan

2. Department of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan

3. Department of Photonics, National Sun Yat-sen University, Kaohsiung, Taiwan

4. Department of Materials and Optoelectronic Science, National Sun Yat-sen University, Kaohsiung, Taiwan

Funder

National Sun Yat-sen University Joint Center for High Value Instruments

Ministry of Science and Technology, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/9741089/09706420.pdf?arnumber=9706420

Reference25 articles.

1. The relationship between Young's modulus of elasticity of organic solids and their molecular structure

2. The path to ubiquitous and low-cost organic electronic appliances on plastic

3. Organic thin-film transistor-driven polymer-dispersed liquid crystal displays on flexible polymeric substrates

4. Analog and digital circuits using organic thin-film transistors on polyester substrates

5. Asymmetric Electrical Properties of Half Corbino Hydrogenated Amorphous Silicon Thin-Film Transistor and Its Applications to Flat Panel Displays

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