Alpha-particle-induced charge collection measurements for megabit DRAM cells-Reference-Cited by-同舟云学术

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Alpha-particle-induced charge collection measurements for megabit DRAM cells

Published:1989-09 Issue:9 Volume:36 Page:1644-1650
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Takeuchi K.,Shimohigashi K.,Takeda E.,Yamasaki E.,Toyabe T.,Itoh K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/16/1424/00034226.pdf?arnumber=34226

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