A Novel Approach to Characterize Commercial CMOS Image Sensors in the Search for Boron to Study Thermal Neutron-Induced Radiation Effects Invited Paper-Reference-Cited by-同舟云学术

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A Novel Approach to Characterize Commercial CMOS Image Sensors in the Search for Boron to Study Thermal Neutron-Induced Radiation Effects Invited Paper

Published:2024-03-07 Issue: Volume:8 Page:130-135
ISSN:
Container-title:2024 Argentine Conference on Electronics (CAE)
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Author:

Espain María Sol¹,Pérez Martín²,Lipovetzky José²,Thorp Silvia I.³,Curotto Paula³,Pozzi Emiliano C.C.³,Marin Julio³,Longhino Juan M.³,Bessia Fabricio Alcalde²,Haro Miguel Sofo²,Blostein Jerónimo J.²,Berisso Mariano Gómez²,Martin Gisele Saint³,González Sara J.⁴,Portu Agustina M.¹

Affiliation:

1. National Atomic Energy Commission (CNEA), National Scientific and Technological Research Council (CONICET), School of Science & Technology, National University of San Martín (UNSAM)

2. National Atomic Energy Commission (CNEA) and National Scientific and Technological Research Council (CONICET).

3. National Atomic Energy Commission (CNEA).

4. National Atomic Energy Commission (CNEA), National Scientific and Technological Research Council (CONICET) and Dan Beninson Institute, National University of San Martín (UNSAM).

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10487127/10487112/10487150.pdf?arnumber=10487150

Reference28 articles.

1. Effect of Cosmic Rays on Computer Memories

2. Alpha-particle-induced soft errors in dynamic memories

3. Alpha-particle-induced charge collection measurements for megabit DRAM cells

4. Radiation-induced soft errors in advanced semiconductor technologies

5. Boron compounds as a dominant source of alpha particles in semiconductor devices

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