SPaRre: selective partial replication for concurrent fault-detection in FSMs-Reference-Cited by-同舟云学术

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SPaRre: selective partial replication for concurrent fault-detection in FSMs

Published:2003-12 Issue:6 Volume:52 Page:1729-1737
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:en
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Drineas P.,Makris Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx5/19/27936/01246543.pdf?arnumber=1246543

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits;Journal of Electronic Testing;2023-05-24

2. A Concurrent Testing Scheme for Muller Circuits Using Reduced Ordered Binary Decision Diagram;2022 IEEE Region 10 Symposium (TENSYMP);2022-07-01

3. A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits with Dynamic and Static C-elements;Journal of Electronic Testing;2019-10

4. A Binary Decision Diagram Approach to On-line Testing of Asynchronous Circuits;2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID);2019-01

5. On-Line Testing of digital VLSI circuits at Register Transfer Level using High Level Decision Diagrams;Microelectronics Journal;2017-09

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