Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions-Reference-Cited by-同舟云学术

Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions

Published:2022-05 Issue:5 Volume:43 Page:721-724
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Tu Hong-Yi¹,Chang Ting-Chang²^ORCID,Tsao Yu-Ching³,Tai Mao-Chou⁴^ORCID,Zheng Yu-Zhe¹,Tu Yu-Fa⁵^ORCID,Kuo Chuan-Wei¹,Wu Chia-Chuan⁶,Tsai Yu-Lin³,Tsai Tsung-Ming¹^ORCID,Lin Chih-Chih¹,Chien Ya-Ting¹

Affiliation:

1. Department of Materials and Optoelectronics, National Sun Yat-sen University, Kaohsiung, Taiwan

2. Department of Physics and the Center of Crystal Research, National Sun Yat-sen University, Kaohsiung, Taiwan

3. Department of Physics, National Sun Yat-sen University, Kaohsiung, Taiwan

4. Department of Photonics, National Sun Yat-sen University, Kaohsiung, Taiwan

5. Institute of Electronics Engineering, National Tsing Hua University, Hsinchu, Taiwan

6. Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/55/9762988/09734008.pdf?arnumber=9734008

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4. Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

5. Analysis of Self-Heating-Related Instability in Self-Aligned p-Channel Polycrystalline-Silicon Thin-Film Transistors

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