Research on Quartz Wafer Defect Detection Method Based on Deep Learning Model Pruning
Author:
Affiliation:
1. University of Science and Technology of China,Hefei Institutes of Physical Science, Chinese Academy of Sciences,Hefei,China
2. Chinese Academy of Sciences,Hefei Institutes of Physical Science,Hefei,China
3. Anhui Jianzhu University,Hefei,China
Funder
Research and Development
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10248366/10248210/10248473.pdf?arnumber=10248473
Reference14 articles.
1. Improved YOLOv3-Based Bridge Surface Defect Detection by Combining High- and Low-Resolution Feature Images
2. A new method in wheel hub surface defect detection: Object detection algorithm based on deep learning
3. Surface Defect Detection of Rolled Steel Based on Lightweight Model
4. Fabric defect detection based on open source computer vision library OpenCV
5. Micro pin header defect detection system based on OpenCV
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