Micro pin header defect detection system based on OpenCV

Author:

Yang Houcheng,Yan Yinxin,Yu Zhangsi,Ning Zhang

Abstract

Abstract In order to solve the problems of low detection efficiency and large detection error in the process of manual quality inspection, a full-automatic defect detection system is built. The system uses an industrial camera, selects a suitable light source for image acquisition, uses the open source OpenCV visual library for image processing and defect contour recognition, and sets the screening conditions for unqualified products. The system can detect whether the needle arrangement has defects in real time and classify them according to different defect categories, It can greatly improve the detection efficiency of needle arranging production enterprises. Through a large number of experimental tests, the detection success rate can reach 98.67%, which shows that the system is feasible.

Publisher

IOP Publishing

Subject

General Physics and Astronomy

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